Process Hierarchy

  Glass frit bonding
Process characteristics:
Alignment type
Method used to align materials to be bonded.
Alignment type*
Method used to align materials to be bonded.
Second substrate side bonded
Second substrate side bonded*
Substrate side bonded
Substrate side bonded
Alignment tolerance
Registration of CAD data to features on wafer
10 µm
Batch size 2
Second substrate diameter 50 mm
Second substrate material Pyrex (Corning 7740)
Second substrate thickness 300 .. 1000 µm
Temperature 400 °C
Wafer size
Wafer size