Process Hierarchy

If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at engineering@mems-exchange.org or call us at (703) 262-5368
on front
  FTIR (Fourier Transform Infrared Spectroscopy)
Process characteristics:
Materials
Material(s) expected to be found on the surface of the sample.
Materials
Available  
Selected
Material(s) expected to be found on the surface of the sample.
Thickness
Thickness of the top material layer on the sample.
Thickness
Thickness of the top material layer on the sample.
unconstrained
Sides inspected
The sides of the wafer inspected by the process
 either
Equipment