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E-beam Lithography: View
Process Hierarchy
Bonding
Clean
Consulting
Deposition
Doping
Etch
LIGA
Lift off
Lithography
   Contact mask lithography
   Maskless lithography
   Miscellaneous lithography
   Projection mask lithography
Mask making
Metrology
Miscellaneous
Packaging
Polishing
Process technologies
Thermal
Unique capabilities

If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at engineering@mems-exchange.org or call us at (703) 262-5368

E-beam Lithography Down
Process characteristics:
Photoresist polarity
Photoresist polarity*
Resist thickness
Desired resist thickness.
Note that this depends on type of resist and the desired minimum feature size.
Resist thickness*
Desired resist thickness. Note that this depends on type of resist and the desired minimum feature size., must be 0.1 .. 1 µm
0.1 .. 1 µm
Min feature size 20 .. 80 nm
Voltage 50000 V
Wafer size
Wafer size
Equipment JEOL 6000 FSE
Equipment characteristics:
Batch sizes 2 .. 100 mm: 1
Beam spot diameter
Area of the beam used to write the mask
3 .. 250 nm
Max field size 50 .. 800 µm
Piece dimension
Range of wafer piece dimensions the equipment can accept
2 .. 100 mm
Piece geometry
Geometry of wafer pieces the equipment can accept
rectangular
Wafer thickness
List or range of wafer thicknesses the tool can accept
200 .. 600 µm