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Wet Thermal Oxidation: View
Process Hierarchy
Bonding
Clean
Consulting
Deposition
   Evaporation
   LPCVD
   Low-stress SiN deposition
   Miscellaneous deposition
   Oxidation
   PECVD
   Spin casting
   Sputtering
Doping
Etch
LIGA
Lift off
Lithography
Mask making
Metrology
Miscellaneous
Packaging
Polishing
Process technologies
Thermal
   Anneal
   Bake
   Oxidation
Unique capabilities

If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at engineering@mems-exchange.org or call us at (703) 262-5368

Wet Thermal Oxidation
Process characteristics:
Thickness
Thickness of grown film.
Thickness*
Thickness of grown film., must be 0.1 .. 6 µm
0.1 .. 6 µm
Material silicon dioxide
Refractive index 1.45
Sides processed both
Temperature 800 .. 1050 °C
Uniformity -0.01 .. 0.01
Wafer size
Wafer size
Equipment Tystar Oxide furnace
Equipment characteristics:
Batch sizes 100 mm: 50, 150 mm: 50
Wafer thickness
List or range of wafer thicknesses the tool can accept
300 .. 800 µm
Extra terms