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HF etch (10:1): View
Process Hierarchy
Bonding
Clean
Consulting
Deposition
Doping
Etch
   Anisotropic etch
   Deep RIE
   Isotropic etch
   Miscellaneous etch
   Strip
LIGA
Lift off
Lithography
Mask making
Metrology
Miscellaneous
Packaging
Polishing
Process technologies
Thermal
Unique capabilities

If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at engineering@mems-exchange.org or call us at (703) 262-5368

HF etch (10:1)
Process characteristics:
Depth
Depth of material removed by etch process
Depth*
Depth of material removed by etch process, must be 0 .. 10 µm
0 .. 10 µm
Etch rate 800 Å/min
Etchant
Solutions and their concentrations.
HF (buffered)
Mask materials
Materials that can be used to mask etching.
silicon nitride
Material silicon dioxide
Sides processed both
Temperature 25 °C
Wafer size
Wafer size
Equipment Wet bech #1
Equipment characteristics:
Batch sizes 100 mm: 25, 150 mm: 25
MOS clean yes
Wafer geometry
Types of wafers this equipment can accept
1-flat, 2-flat, notched, no-flat
Wafer holder
Device that holds the wafers during processing.
teflon cassette
Wafer materials
List of wafer materials this tool can accept (not list of all materials, just the wafer itself).
quartz (fused silica), fused silica, silicon, silicon on insulator
Wafer thickness
List or range of wafer thicknesses the tool can accept
300 .. 1000 µm
Comments:
  • BOE etch.
Extra terms