Attached files

profile_before_device_etch_3_SOI_wafer_.tif (768.6 KB, image/tiff): attached by szabo (Attila Szabo) on 2008-03-19 17:36; last SOI test measuring point 3 /wafer: test SOI 1/
profile_before_device_etch_2_SOI_wafer_.tif (768.6 KB, image/tiff): attached by szabo (Attila Szabo) on 2008-03-19 17:36; last SOI test measuring point 2 /wafer: test SOI 1/
profile_before_device_etch_1_SOI_wafer_.tif (768.6 KB, image/tiff): attached by szabo (Attila Szabo) on 2008-03-19 17:36; last SOI test measuring point 1 /wafer: test SOI 1/
profile_before_device_etch_silicon_wafer_.tif (768.6 KB, image/tiff): attached by szabo (Attila Szabo) on 2008-03-19 17:36; Last test on standard test wafer. Following tests were made on SOI wafer /wafer: test poly 2/