logo
Contact photolithography (Shipley 1827): View
Process Hierarchy
Bonding
Clean
Consulting
Deposition
Doping
Etch
LIGA
Lift off
Lithography
   Contact mask lithography
   Maskless lithography
   Miscellaneous lithography
   Projection mask lithography
Mask making
Metrology
Miscellaneous
Packaging
Polishing
Process technologies
Thermal
Unique capabilities

If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at engineering@mems-exchange.org or call us at (703) 262-5368

on front
Contact photolithography (Shipley 1827)
on front
HMDS coat
MaterialHMDS
MaterialShipley 1827Thickness2.7 µm
on front
Optical Exposure
MaterialShipley 1827
Process characteristics:
Alignment side
Alignment side*
Perform hard bake
Perform hard bake*
yes no
Batch size 1
Magnification 1
Material Shipley 1827
Resist thickness 2.7 µm
Sides processed either
Wafer size
Wafer size
Comments: