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Multipoly process: Recipe #2: View
Process Hierarchy
Bonding
Clean
Consulting
Deposition
   Evaporation
   LPCVD
   Low-stress SiN deposition
   Miscellaneous deposition
   Oxidation
   PECVD
   Spin casting
   Sputtering
Doping
Etch
LIGA
Lift off
Lithography
Mask making
Metrology
Miscellaneous
Packaging
Polishing
Process technologies
Thermal
Unique capabilities

If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at engineering@mems-exchange.org or call us at (703) 262-5368

Multipoly process: Recipe #2
Batch size 50
Excluded materials gold (category), copper
Material polysilicon
Microstructure polycrystalline
Radius of curvature of released structures 6 mm
Residual stress 29 MPa
Sides processed both
Stress gradient 1.5 MPa/µm
Temperature 615 °C
Thickness 3.12 µm
Wafer size
Wafer size
Equipment MRL furnace 321-2
Equipment characteristics:
Wafer holder
Device that holds the wafers during processing.
quartz chuck
Wafer materials
List of wafer materials this tool can accept (not list of all materials, just the wafer itself).
silicon
Wafer thickness
List or range of wafer thicknesses the tool can accept
200 .. 1000 µm
Comments:
  • This zero-stress multipoly recipe involves 8 sequential depositions with following thickness values (starting at substrate) 0.31, 0.52, 0.24, 0.52, 0.22, 0.52, 0.31, 0.48 (all in µm).
  • Odd numbered layers were deposited at 615 C and even numbered layers deposited at 570 C.
Extra terms