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Nichrome DC-magnetron sputtering (high power): View
Process Hierarchy
Bonding
Clean
Consulting
Deposition
   Evaporation
   LPCVD
   Low-stress SiN deposition
   Miscellaneous deposition
   Oxidation
   PECVD
   Spin casting
   Sputtering
Doping
Etch
LIGA
Lift off
Lithography
Mask making
Metrology
Miscellaneous
Packaging
Polishing
Process technologies
Thermal
Unique capabilities

If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at engineering@mems-exchange.org or call us at (703) 262-5368

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Nichrome DC-magnetron sputtering (high power)
Process characteristics:
Thickness
Amount of material added to a wafer
Thickness*
Amount of material added to a wafer, must be 0.01 .. 0.2 µm
0.01 .. 0.2 µm
Ambient
Ambient to which substrate is exposed during processing
vacuum
Batch size 1
Deposition rate
Rate at which material is added to a wafer
0.078 µm/min
Excluded materials gold (category), copper
Material Nichrome
Pressure
Pressure of process chamber during processing
5 mTorr
Sides processed either
Temperature 27 °C
Wafer size
Wafer size
Equipment Denton Discovery 24
Equipment characteristics:
Wafer holder
Device that holds the wafers during processing.
stainless steel
Wafer materials
List of wafer materials this tool can accept (not list of all materials, just the wafer itself).
alumina, Borofloat (Schott), silicon, silicon dioxide
Wafer thickness
List or range of wafer thicknesses the tool can accept
300 .. 1000 µm
Comments:
  • This process uses a cathode power of 750W. An rf preclean can be performed.
Extra terms